Recovering imaging device sensitivities: a data-driven approach



Recovering spectral sensitivities of imaging devices with indirect methods, as well as spectral stimuli estimation from device responses are ill-posed problems. All known methods have to rely on a priori information to constrain the solution space, which, in most situations, is difficult or even impossible to obtain. In this paper we introduce a simple and fully data-driven approach for indirect spectral sensitivity estimation. The method is built upon an extension of our previous work on Generalized Cross-Validation for constraint Tikhonov problems and utilizes a linear combination of band-limited basis functions.


Spectral data estimation, CCD sensitivity calibration, reflectance


Multi-spectral Imaging

Related Project

C-BASED: A framework for color-based inspection for industrial applications


IEEE Int. Conf. on Image Processing, October 2004

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